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Home » Authors » Donald K. Cohen Ph.D.

Donald K. Cohen Ph.D.

Donald K. Cohen, Ph.D., is founder of Michigan Metrology (Livonia, MI). For more information, call (734) 953-5030, e-mail [email protected] or visit www.michmet.com.
Articles

ARTICLES

Cover image of wear test sample with dime, Michigan Metrology.
Measurement

3D Optical Profiling Breaks the Speed Limit

Today 3D optical profiling can provide an ever-growing range of measurements in medical devices, semiconductors, automotive production, aerospace, materials, machining, and more.
Donald K. Cohen Ph.D. Mike Zecchino
August 15, 2024

3D optical profiling, developed in the early 1990s, is crucial for high-resolution measurement of optics, semiconductors, medical devices, and precision machining. Recent developments have expanded its capabilities, allowing high-resolution surface texture measurements over many square millimeters in minutes.


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engine block

Hidden Waviness: When Measuring Roughness Cannot Solve Quality Challenges

Roughness and waviness are dictated by each particular application.
Mike Zecchino Mark Malburg Donald K. Cohen Ph.D.
June 1, 2020

Specifications for surface texture frequently focus on surface “roughness”—the finer structures in the texture—often to the exclusion of the “waviness”—the larger structure of the texture. Unfortunately, problems related to sealing, vibration, noise, wear, etc., are regularly caused by issues hidden in the waviness domain, which cannot be captured by common roughness specifications.


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Figure 1. Asperities making plastic contact with flat, smooth, rigid, hard plate with  load (i.e. weight), W.

If you need less sliding friction, should you make the surface rougher or smoother?

Think quick!
Donald K. Cohen Ph.D.
January 3, 2017

How does the surface texture affect the friction between two dry parallel sliding surfaces? It turns out that this problem has challenged some of the greatest minds in science and engineering.


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wavelength graph roughness
Quality 101

Texture Measurements

Donald K. Cohen Ph.D.
November 2, 2012
Filter spatial wavelengths for accurate surface roughness measurements.
Read More
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